PROBLEM
Factory challenge
Pass/fail results are separated from calibration, uncertainty, MSA and process context.

D · METROLOGY
Quantify surface, geometry, thickness and thermal conditions while preserving metrology traceability.
PROBLEM
Pass/fail results are separated from calibration, uncertainty, MSA and process context.
APPROACH
Combine 3D, web gauge, spectral and thermal measurement with QualityOS.
PERFORMANCE · target metrics
※ Figures are planning assumptions, agreed per sample and site conditions via PoC gates.
Metrology Pipeline
3D/HSI scans reconstruct surfaces and AI classifies defects, but verdicts run on measurements backed by calibration and uncertainty.
High-resolution scanning via laser, structured light and hyperspectral.
Precisely reconstruct geometry from point clouds and surface models.
Quantify dimensions, steps, burrs, warp and foreign matter.
Combine AI defect classification with tolerances and SPC.
Recirculate lot tracking and process-improvement data via QualityOS.
SOLUTIONS
Quality data connecting calibration, recipes, SPC and lots
Inline 3D surface, shape and dimensional metrology
Measures steps, burrs, beads, warpage and surface geometry at production speed with explicit calibration and measurement-system criteria.
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Fused cross-web metrology for films and electrodes
Synchronizes thickness, width, surface and thermal data on continuous materials to trace process variation and defect position by lot.
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Recipe, calibration, model, SPC and lot traceability
Organizes inspection and metrology results, recipes, calibration, models and lot history in a common quality data structure.
Learn moreWhy our Metrology
AI accelerates defect classification but never replaces measurement traceability, calibration or uncertainty. Only on verified measurement do AI verdicts and SPC earn trust.
Optics & Metrology Stack
PROOF & DELIVERABLES
Acceptance is based on the documents, data and procedures needed for approval and operation.
INTEGRATION
METROLOGY
Specifications and performance are agreed through sample and site-specific PoC gates.