InspectAI
Low-data hybrid AI visual inspection
Combines rule-based logic and Hybrid AI to validate defect decisions while preserving evidence, dataset lineage and production operating criteria.
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SEMICONDUCTOR & ELECTRONICS
Semiconductor & Electronics
Connect fine visual and dimensional inspection, clean mobility and Edge AI operations.
FACTORY PAINS
Priority factory bottlenecks
Start from recurring losses and ownership gaps, not technology labels.
- 01
Fine defects and frequent multi-product recipe changes
- 02
Processing and retention cost of high-resolution images
- 03
Disconnected model versions across equipment and inspection tools
- 04
Complex clean-environment logistics and equipment interfaces
REFERENCE ARCHITECTURE
Application architecture
The focus is how data and machine action connect, not a list of boxes.
- 01
Configure
Match optics, 3D sensors and recipes to product and process conditions.
- 02
Inspect
InspectAI combines rule-based and AI decisions.
- 03
Deploy
VisionOps and EdgeBox manage model and device versions.
- 04
Measure
SurfaceMetrix and QualityOS connect geometry, calibration and lot history.
- 05
Move
FleetOS coordinates clean-room mobile systems and equipment missions.
RECOMMENDED SOLUTIONS
Recommended solution set
Select only the required components and make interfaces and ownership explicit.
VisionOps
Edge deployment, model operations and continual learning
Manages device, recipe, model and deployment versions so approved releases, rollback and performance review can be operated consistently.
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SurfaceMetrix 3D
Inline 3D surface, shape and dimensional metrology
Measures steps, burrs, beads, warpage and surface geometry at production speed with explicit calibration and measurement-system criteria.
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EdgeBox AI
Validated real-time industrial AI node
Packages compute, I/O, thermal, power and software into an approved configuration matched to a specific factory workload.
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FleetOS
Multi-vendor fleet orchestration and traffic management
Coordinates heterogeneous mobile robots, traffic, charging and plant missions while preserving safety interfaces and operational ownership.
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QualityOS
Recipe, calibration, model, SPC and lot traceability
Organizes inspection and metrology results, recipes, calibration, models and lot history in a common quality data structure.
Learn moreKPI ITEMS
KPIs to measure
- Defect and dimensional criteria
- Product changeover time
- Takt time
- Model and recipe change approval
- Data retention and search
- Clean, ESD and safety conditions
GATE PROCESS
Deployment gates
- 01DiscoverySite diagnosis
- 02PoCFeasibility
- 03PilotLine integration
- 04Roll-outProduction deployment
- 05OperateImprove
FAQ
Questions before assessment
Must all high-resolution data be sent to a central server?
No. We design the boundary between edge decisions and central history according to latency, security and storage cost, with separate policies for raw, feature and result data.
How are multi-product recipes managed?
Product, equipment, model and optical conditions are packaged into a versioned recipe with approval, deployment and rollback procedures.
SEMICONDUCTOR & ELECTRONICS
Define the scope for your Semiconductor & Electronics site
We review the baseline, samples, interfaces, safety and quality conditions and propose the PoC gates.