An automated system analyzing semiconductor inspection images and manufacturing data

VISION AI

DataForge

Synthetic defects, assisted labeling and dataset management — Supports rare-defect development while preserving the source, label, usage rights and training lineage of manufacturing datasets.

Concept · validation required
01

Identify data shortages before model development

02

Control the approved use of synthetic and augmented data

03

Trace label quality, dataset versions and training history

COMPONENTS

Components

  • Dataset registry
  • Labeling workbench
  • Synthetic and augmentation pipeline
  • Lineage and access controls

INTEGRATION

Integration

  • Image storage
  • VisionOps
  • Training environment
  • Identity and access management

DELIVERABLES

Deliverables

  • Dataset card
  • Labeling guideline
  • Synthetic-data review record
  • Model training lineage

VALIDATION ITEMS

What must be validated before specifications

Performance, specifications and schedule are confirmed only after validating the actual samples and site conditions.

  1. 01Data rights
  2. 02Synthetic-data bias
  3. 03Label consistency
  4. 04Security and data-export conditions

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DataForge

Validate feasibility with actual samples and site conditions

Product status and specifications are stated in the proposal based on validation and supply conditions.

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